Salt erosion is a common and most destructive atmospheric corrosion. Generally speaking, the main corrosion of salt mist is sodium chloride in the ocean u0026 mdash; u0026 mdash; sodium chloride. The corrosion of salt fog on the surface of the metal material is caused by electrochemical reactions of the oxidation layer and protective layer contained in the metal surface with chloride ions contained in the metal surface. At the same time, chloride ions contain a certain hydrophobic energy, which is easily adsorbed on the pores on the metal surface, the cracks are crowded and replaced the oxygen in the chlorine layer, turning insoluble oxides into soluble chloride, making the passivation surface become lively surface. Causes bad reactions to the product. In order to ensure that electronic and electronic products can be used normally under the conditions of salt -containing atmosphere, it is necessary to test its anti -salt fog corrosion capacity, that is, the salt fog test. Since the finished or semi -finished product of electronic products is composed of separate components through a series of orderly connections, it is often necessary to detect the anti -salt fog corrosion capacity of a certain part of the finished product or semi -finished product to determine whether it meets the requirements of the requirements. Essence At present, the objects of salt and mog tests are limited to the whole of electronic products or components, and they cannot perform a single test of a specific meta device or local connection part of the electronic product.
The main purpose of the present invention is to provide a local detection method for anti -salt fog corrosion capabilities, which can effectively anti -salt and fog in any part of the finished parts or semi -finished products of electronic products. Ability test.
The solution used by the present invention is:
A local detection method of anti -salt fog corrosion, including The following steps:
(i) The parts that prepare the anti -salt fog ability test in the electronic product are covered with tape or rubber puree, sealed at the edge Broken off;
(2) Select a small piece of wax to heat the wax to melt, and has good liquidity;
(3) Place the electronic products in the molten wax lightly lightly Take it out and wait for waxing;
(4) pull the lead in steps (i) to remove the covered tape or rubber mud and expose the measured parts. At this time Both are covered with a layer of wax, so that the salt mist test only occurs on the measured site;
(5) The salt fog test of the electronic product was performed.
Further, the wax is a mixed wax for paraffin or paraffin and other ingredients.
The advantages and positive effects of the present invention are: the present invention provides a local detection method for anti -salt and fog corrosion capabilities, which can perform a single test of a specific meta -device or local connection site in the electronic product. The test results are accurate and the position is accurate; not only avoids the test analysis of local anti -salt fog ability in the overall test, but also can effectively test the connection parts between components to determine the connection effect.
Specific implementation method:
Below the specific implementation method to further explain the present invention, but it cannot be used as a limited of the invention.
The anti -salt fog ability test of a integrated circuit board is tested, and the steps include: 0015
(1) Part of the components of the integrated circuit board for the test of salt fog ability testingRubber mud covers, the edges are tightly sealed, and a lead is extended from the edge of the rubber puree;
(2) Select a small piece of paraffin to heat the paraffin to melt and have good liquidity;
(3) Place the integrated circuit board in the melting paraffin and remove and remove it, wait for waxing;
(4) pull the lead in steps (i) to make the covered rubber pureeFall off and expose the measured parts;
(5) The integrated circuit board was conducted on salt and mist test.
