High Temperature Aging Test>Practical Specifications
1. High Temperature Aging Test Range:
This specification specifies the high temperature aging process and the rules of operation.
This specification applies to the company's products that have a have high need temperature aging .
2, the purpose of high-temperature aging screening:
To improve product reliability and eliminate processing stress and residual solvents, simulate a harsh work environment to identify and eliminate product craft and early failures caused by components to ensure the excellent quality and expected life of the whole machine and enter a stable period of high reliability.
3. Basic requirements for high-temperature aging test:
3.1 High Temperature Aging Screening Object
3.1.1 Products subjected to aging testsn should be qualified for assembly and commissioning;
3.1.2 The semi-finished products , products and main functional modules of the company.
3.2 Simulation Status Requirements
3.2.1 In order to ensure stable and reliable performance of the product, check the working state of the Product should be simulated during aging ;
3.2. 2 When aging products need input signals When it is used, it should be carried out under the rated output power state, while taking good heat dissipation measures.
3.2.3 For high frequency devices should:
a) The connection and connection of the signal line and charging line of the equipment The output should be carried out according to the basic operating requirements and the actual operating condition of the equipment;
b) The output terminal of the device should be connected to a load of suitable impedance be connected, and the rated power of the load should not be less than The rated output power of the whole machine is 2 to 3 times;
c) An isolator or circulator should be added between the signal source and the devicebe;
d) It is strictly forbidden to use the output signal of the high-power power amplifier to combine via a combiner and then switch to the connection mode of the load.
4, preparations and precautions before aging:
a) Before aging, confirm if the super and Low temperature test chamber equipment is in good condition;
b) When multiple aging products are tested together, there should be enough space between each aging product to allow for high and low temperature testing. The temperature in the chamber issufficiently even.
aging products should not be stacked or placed incorrectly so as not to affect the aging effect and cause damage to the products.
5 . High temperature aging temperature and time:
High temperature aging temperature and time can be selected as follows:
a) Continuous power-on aging at room temperature shall not be less than 96 hours;
b) Under the condition of 40℃±2℃the continuous power-on aging shall not be less than 72 hours;
c) Under the condition of 45°C±2°C, the continuous aging of electricity shall not be less than 48 hours;
d) continuous aging at power on at 50℃±2℃ shall not be less than 24 hours;
e) Continuous power-on aging at 55°C±2°C should not be less than 12 hours.
6. High Temperature Aging Process:
6.1 Apply the working voltage specified in the product standard to the aging product.
6.2 When the aging product is turned on, set the temperature of the high and low temperature test chamber heating up to the specified test temperature, the change in ambient temperature during the aging process should
Within ±2℃ of the specified temperature.
6.3 Start when the aging temperature reaches the specified value Timing after the temperature is constant.
6.4 During the aging process, the aging should be checked every 2 HoursWhether the operation of the chamber is stable, especially the measurement temperature. If abnormal temperature is detected during the aging process
, es the power supply should be cut off immediately. Resume aging after the aging room returns to normal.
6.5 The main index For performance index detection, the specific index types and Parameters can be found in the technical description of the conversion document
Described in the specification.
a) Traditional product aging, test once every 5 to 6 hours and monitor the temperature during the TRecord ests;
b) Conventional product aging, adopt random testing method, each test product should not be less than 10%;
c) If there is a problem with the tested model equipment, you should increase the number of tests for this type of product according to the actual situation, which is not much At
10 %.
6.6 If the product fails during the aging process, it should be listed in the Notes column of Appendix A. Note the error condition.
6.7 After aging, the product is at room temperature. After a standing time of at least 2 hours, production planning carries out a review, creates a test report and presents it after the test has been passed
Verification by testing agency.
6.8 The single disk test is performed after burn-in, and the test items include monitor function, output voltage value, etc. The Number of sample tests should not be less than 20%, for example
If there are unqualified test samples after aging, all batches must be tested.
Note: A single disk in this specification refers to a single disk or module provided directly to users.
7. Logo:
a) Products that pass the aging test should be marked with a green label on the product surface, easy to remove note;
b) Products that fail the aging test should be checked in the product. The surface is marked with a red label.VIII. Test recordings :
8.1 Fill in the aging test records according to the test items, see Appendix A.
8.2 For individual hard drive aging test records, see Appendix B.
8.3 The aging test record form should be submitted by the relevant personnel every month.
9. Maintenance requirements for aging equipment for high and low temperature test chambers:
9.1 All test devices in the aging test should be tested and checked regularly,
9.2 Inspection of all aging facilities should be performed once a month. The main inspection points are:
——The calibration of the temperature control system of the high and low temperature test chamber of the aging plant;
——SWR Aging Stress Test;
——A test of the signal source's output signal accuracy;
——The power supply output voltage test
9.3 Test results should be presented in a formal and consistent format .